V
Docket No.: 50099-254
PATENT
IN THE
STATES PATENT AND TRADEMARK OFFICE
In re Application of
Customer Number: 20277
Tohru KOYAMA, et al.
Confirmation Number: 7582
Serial No.: 10/830,090
Group Art Unit: 2825
Filed: April 23, 2004
Examiner: Unknown
For:
FAILURE ANALYZER
INFORMATION DISCLOSURE STATEMENT
Mail Stop IDS
Commissioner for Patents
P.O. Box 1450
Alexandria, VA 22313-1450
Dear Sir:
In accordance with the provisions of 37 C.F.R. 1.56, 1.97 and 1.98, the attention of the Patent and
Trademark Office is hereby directed to the documents listed on the attached form PTO-1449. It is respectfully
requested that the documents be expressly considered during the prosecution of this application, and that the
documents be made of record therein and appear among the "References Cited" on any patent to issue therefrom.
This Information Disclosure Statement is being filed within three months of the U.S. filing date OR
before the mailing date of a first Office Action on the merits. No certification or fee is required.
Please charge any shortage in fees due in connection with the filing of this paper, including
extension of time fees, to Deposit Account 500417 and please credit any excess fees to such deposit account.
600 13 th Street, N.W.
Washington, DC 20005-3096
(202) 756-8000 SAB:tlg
Facsimile: (202) 756-8087
Date: July 28, 2004
Respectfully submitted,
[OJY WILL & EMERY LLP
INFORMATION DISCLOSES}
CITATION IN AN
APPLICATION
SHEET 1 OF 1
(PTO-1449)
ATTY. DOCKET NO.
50099-254
SERIAL NO.
10/830,090
APPLICANT
Tohru KOYAMA, et al.
FILING DATE
April 23, 2004
U.S. PATENT DOCUMENTS
GROUP
2825
If EXAMINER'S
INITIALS
CITE
NO.
Document Number
Number-Kind Code2 a known)
Publication Date
MM-DD-YYYY
Name of Patentee or Applicant of Cited
Document
Pages, Columns, Lines, Where
Relevant Passages or Relevant
Figures Appear
US
5,208,648
5/4/1993
INTERNATIONAL BUSINESS MACHINES
CORPORATION
Corresponds to JP 5-157701
US
10/684,507 copy of
claims and drawings
Filed 10/15/03
US
10/697,277 copy of
claims and drawings
Filed 10/31/2003
US
US
US
US
US
US
US
US
us
us
us
1 1 FOREIGN PATENT DOCUMENTS j
EXAMINER'S
INITIALS
CITE
NO.
Foreign Patent Document
Country Codes -Number « -Kind
Codes (if known)
Publication Date
MM-DD-YYYY
Name of Patentee or
Applicant of Cited Document
Pages, Columns, Lines
Where Relevant
Figures Appear
Translation
Yes
NO
JP 2002-18900 A
7/5/2002
NEC CORP
w/English
Abstract
JP 5-157701
6/25/1993
INTERNATIONAL
BUSINESS MACHINES
CORPORATION
Corresponding
U.S. 5,208,648
OTHER ART (Including Author, Title, Date, Pertinent Pages, Etc.)
EXAMINER'S
INITIALS
CITE
NO.
Include name of the author (in CAPITAL LETTERS), title of the article (when appropriate), title of the item (book, magazine,
journal, serial, symposium, catalog, etc.), date, page(s), volume-issue number(s), publisher, city and/or country where
published.
EIJI YOSHIDA ET AL., "High Resolution Laser Voltage Probing", collection of drafts, LSI testing symposium, ULSI
Development Center, Evaluation and Analysis Department. Mitsubishi Electric Corporation, pp. 143-147
S.B. iPPOLITQ ET AL., "High Spatial Resolution Subsurface Microscopy", Applied Physics Letters, Vol. 87, No. 26, June 25,
2001, pp. 4071-4073
H. TERADA, "Effectiveness of Solid Immerse Lens", a document from the 14th Semiconductor Workshop Discourse hosted
by Hamamatsu Photonics K.K., pp. 1 -3
EXAMINER
DATE CONSIDERED
'EXAMINER: Initial if reference considered, whether or not citation is in conformance with MPEP 609. Draw line through citation if not in conformance and not considered.
Include copy of this form with next communication to applicant.
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